Analog Circuit Design for Process Variation-Resilient Systems-on-a-Chip
Nonfiction, Science & Nature, Technology, Electronics, Circuits
| Author: | Marvin Onabajo, Jose Silva-Martinez | ISBN: | 9781461422969 |
| Publisher: | Springer New York | Publication: | March 8, 2012 |
| Imprint: | Springer | Language: | English |
| Author: | Marvin Onabajo, Jose Silva-Martinez |
| ISBN: | 9781461422969 |
| Publisher: | Springer New York |
| Publication: | March 8, 2012 |
| Imprint: | Springer |
| Language: | English |
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.
- Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
- Includes built-in testing techniques, linked to current industrial trends;
- Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
- Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
This book describes several techniques to address variation-related design challenges for analog blocks in mixed-signal systems-on-chip. The methods presented are results from recent research works involving receiver front-end circuits, baseband filter linearization, and data conversion. These circuit-level techniques are described, with their relationships to emerging system-level calibration approaches, to tune the performances of analog circuits with digital assistance or control. Coverage also includes a strategy to utilize on-chip temperature sensors to measure the signal power and linearity characteristics of analog/RF circuits, as demonstrated by test chip measurements.
- Describes a variety of variation-tolerant analog circuit design examples, including from RF front-ends, high-performance ADCs and baseband filters;
- Includes built-in testing techniques, linked to current industrial trends;
- Balances digitally-assisted performance tuning with analog performance tuning and mismatch reduction approaches;
- Describes theoretical concepts as well as experimental results for test chips designed with variation-aware techniques.
