Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications

Nonfiction, Science & Nature, Science, Chemistry, Physical & Theoretical, Technology, Material Science
Cover of the book Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications by , Springer New York
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: ISBN: 9780387958682
Publisher: Springer New York Publication: September 19, 2009
Imprint: Springer Language: English
Author:
ISBN: 9780387958682
Publisher: Springer New York
Publication: September 19, 2009
Imprint: Springer
Language: English

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.

View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

In Advanced ULSI interconnects – fundamentals and applications we bring a comprehensive description of copper-based interconnect technology for ultra-lar- scale integration (ULSI) technology for integrated circuit (IC) application. In- grated circuit technology is the base for all modern electronics systems. You can ?nd electronics systems today everywhere: from toys and home appliances to a- planes and space shuttles. Electronics systems form the hardware that together with software are the bases of the modern information society. The rapid growth and vast exploitation of modern electronics system create a strong demand for new and improved electronic circuits as demonstrated by the amazing progress in the ?eld of ULSI technology. This progress is well described by the famous “Moore’s law” which states, in its most general form, that all the metrics that describe integrated circuit performance (e. g. , speed, number of devices, chip area) improve expon- tially as a function of time. For example, the number of components per chip d- bles every 18 months and the critical dimension on a chip has shrunk by 50% every 2 years on average in the last 30 years. This rapid growth in integrated circuits te- nology results in highly complex integrated circuits with an increasing number of interconnects on chips and between the chip and its package. The complexity of the interconnect network on chips involves an increasing number of metal lines per interconnect level, more interconnect levels, and at the same time a reduction in the interconnect line critical dimensions.

More books from Springer New York

Cover of the book Molecular Genetics of Axial Patterning, Growth and Disease in the Drosophila Eye by
Cover of the book Comparative Physiology of the Vertebrate Kidney by
Cover of the book Bioinformatics by
Cover of the book The Psychology of Physical Symptoms by
Cover of the book Real World Ecology by
Cover of the book Atlas of Vaginal Reconstructive Surgery by
Cover of the book Chemical Dependence by
Cover of the book Mathematics Without Boundaries by
Cover of the book Handbook of Applied Developmental Science in Sub-Saharan Africa by
Cover of the book Business Analytics by
Cover of the book Percutaneous Laser Disc Decompression by
Cover of the book Handbook of Religion and Spirituality in Social Work Practice and Research by
Cover of the book Rare Malignant Skin Tumors by
Cover of the book Evaluating Mental Health Disability in the Workplace by
Cover of the book Diseases of the Sinuses by
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy